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Home » Eclipse Projects » Commercial » ANN: Eclipse XRay Profiler
ANN: Eclipse XRay Profiler [message #560713] Sun, 12 June 2005 23:17
Chris Laffra is currently offline Chris LaffraFriend
Messages: 253
Registered: July 2009
Senior Member
I am pleased to announce Eclipse XRay Profiler v2.8.5.

XRay can be used for analyzing, monitoring, and profiling of Eclipse

A free download can be found here:

XRay has been tested on Eclipse 3.0 through the latest build, on various
JVMs. It is very scalable, and can be used to profile something as big as
IBM RAD, which routinely loads hundreds of plugins.

XRay is different from other profilers, because it is really integrated
deeply into Eclipse. For example, it has been implemented as a plugin that
runs inside the target being profiled, which makes it very aware of lots of
specific Eclipse events.

Chris Laffra,
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