EMF Feature Model is a proposed open source project under the Eclipse Modeling Framework Technology Project (EMFT).
During the last years Feature Modeling has become the "standard" for variability management in the field of Software Product Lines. Feature Models are easy to understand and provide a generic way to represent variability information, independent of a specific application domain. Several independent projects using the Eclipse platform / EMF have each defined their own meta model for feature models. Although these meta models have considerable structural differences, their core semantics are similar. A brief description of feature models can be found at Wikipedia. The EMF Feature Model project will define a standard representation of Feature Models inside the Eclipse platform. The intent is to provide a uniform representation for variability information for tools based on the Eclipse Modeling Framework. This will allow easy and consistent access to variability-related information, such as variation points and variant decisions, in DSLs, M2M transformations, and other contexts where variability information is produced or consumed.
The objectives of the EMF Feature Model project are the following:
A first version of the EMF Feature Model is available in the public Git at:
This first release acts as base for public discussion at EMF feature Model mailing list.
More information here soon...
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